| Sign In | Join Free | My xuijs.com |
|
Top Metallization : TiW + Au, 2.5µm min
Certification : ISO 9001:2015, RoHS
RoHS : Compliant (EU 2015/863)
MOQ : 10 Pieces
Chip Dimensions : 0.50 x 0.50 x 0.15mm
Customization : Capacitance 10pF-1000pF, geometry up to 4:1, bordered electrode, floating backside
Payment Terms : T/T,L/C,D/A,D/P
Delivery Time : 5-7 working days for stock, 3-4 weeks for production
Mounting Type : Wire Bondable / Eutectic Die Attach
Brand Name : Hoan
Model Number : HACC102S50V300
Operating Temperature : -55°C to +125°C
Place of Origin : Shaanxi, China
Product overview: The HACC102S50V300 is a single-layer metal-oxide-semiconductor (MOS) capacitor with a nominal capacitance of 1000pF (1nF) ±10% and a 50V DC working voltage. It uses a 300nm thermal silicon dioxide (SiO2) dielectric on a float-zone silicon substrate with a TiW-Au metallization stack. Its defining feature is a nanoscale staggered guard-ring around the top electrode, which lengthens the surface leakage path and confines the electric field so that leakage current stays in the pico-amp range. It suits precision and high-impedance RF and analog circuits where leakage directly limits accuracy.
A guard ring is a conductive or insulating structure placed around the active electrode to intercept surface leakage current and keep it away from the signal path. A staggered guard-ring uses several closely spaced nanoscale rings rather than a single large one. This increases the effective surface path length and spreads the electric field across multiple steps, so the field at any single point is lower and the surface leakage that would otherwise flow between terminals is strongly reduced. The result is leakage in the pico-amp range, which matters in high-impedance circuits where even nanoamp leakage would load or offset the signal.
| Parameter | Value | Condition |
| Capacitance | 1000pF (1nF) ±10% | 1MHz, 1.0Vrms |
| Rated DC voltage | 50V | Continuous |
| Dielectric strength | >125V DC | 1 minute, 25°C |
| Leakage current | <100 pA | 50V DC, 25°C, typical |
| Guard-ring design | Nanoscale staggered multi-ring | Surface leakage suppression |
| Intrinsic chip ESL | <0.05nH | De-embedded from S-parameters |
| Q factor at 1MHz | >2000 | Typical |
| Dielectric absorption | <0.1% | Typical |
| TCC | +35ppm/°C | -55°C to +125°C |
| Dielectric | Thermal SiO2, 300nm | Low defect density |
| Substrate | Float-zone Si, >1000 Ω·cm | High-resistivity |
| Chip dimensions | 0.50 × 0.50 × 0.15mm | ±0.025mm |
| Top metallization | TiW + Au, 2.5µm min | Wire bondable |
| Backside metallization | TiW-Pt-Au, Au 1.0µm min | Die attach |
| Operating temperature | -55°C to +125°C | — |
| RoHS | Compliant | EU 2015/863 |

|
|
Nanoscale Staggered Guard-Ring MOS Capacitor 1000pF 50V Single Layer Chip For Pico-Amp Leakage Images |